• Uncoated front surface for beam sampling

• Fresnel reflectance from 1–10% at 45°

• AR coated back surface eliminates ghosting

• Slight wedge virtually eliminates internal fringes

• N-BK7 or UV fused silica substrates 

Our broadband beam samplers are designed to split off, or sample, a beam by Fresnel reflection for beam monitoring applications where minimum disturbance of the transmitted beam is necessary. The precision optical substrate is uncoated on the front surface to achieve beam division by Fresnel reflection. The back surface is antireflection coated to prevent ghosting. A slight wedge in the substrate virtually eliminates internal fringes. Depending on the polarization of the incident beam, front surface reflectance from 1–10% can be attained at 45° incidence.

These beam samplers are available in either N-BK7 for general use, or UV grade fused silica for optimal wavefront and thermal stability. Coating options cover the visible to near infrared regions.