The 10Q20NC.UV Broadband Beam Sampler is a 1.0 inch (25.4 mm) diameter, 6.10 mm thick, UV fused silica beam sampler with a λ/10 surface flatness. It is 255-440 nm anti-reflection coated on the back surface. Our broadband beam samplers are designed to split off or sample a beam by Fresnel reflection for beam monitoring applications where minimum disturbance of the transmitted beam is necessary.

• 直径

  25.4 mm  

• 增透膜

  255-440 nm

• 材料

  UV Grade Fused Silica

• 表面质量

  15-5 scratch-dig

• 入射角

  45°

• 镀膜代码

  NC.UV

• 基板编号

  10Q20

• 表面平面度

  ≤λ/10 at 632.8 nm over the clear aperture

• 耐用性

  MIL-C-675C, adhesion, abrasion and solubility

• 倒角

  0.25-0.76 mm face width

• 倒角公差

  45° ±15°

• 清洁

  See How to Clean Optics

• 通光孔径

  > central 80% of diameter

• 损伤阈值

  1.0 J/cm2 with 10 nsec pulses, 10 Hz @ 266 nm, typical

• 直径公差

  +0/-0.13 mm

• 楔形

  30 ±15 arc min

• 效率

  Ravg < 1% @ 255-440 nm

• 厚度

  6.1 mm  

• 厚度公差

  ±0.38 mm

10 q20nc。紫外宽带束取样器是一个1.0英寸(25.4毫米)直径,6.10毫米厚,紫外线石英束取样器λ/ 10表面平坦。背面涂有255-440纳米的防反射涂层。我们的宽带波束采样器被设计成通过菲涅尔反射将波束分离或取样，用于需要对传输波束进行最小干扰的波束监控应用。