The 20Q40NC.2 Broadband Beam Sampler is a 2.0 inch (50.8 mm) diameter, 9.40 mm thick, UV fused silica beam sampler with a λ/20 surface flatness. It is 660 to 1000 nm anti-reflection coated on the back surface. Our broadband beam samplers are designed to split off or sample a beam by Fresnel reflection for beam monitoring applications where minimum disturbance of the transmitted beam is necessary.

• 直径

  50.8 mm  

• 增透膜

  660-1000 nm

• 材料

  UV Grade Fused Silica

• 表面质量

  10-2 scratch-dig

• 入射角

  45°

• 镀膜代码

  NC.2

• 基板编号

  20Q40

• 表面平面度

  ≤λ/20 at 632.8 nm over the clear aperture

• 耐用性

  MIL-C-675C, moderate abrasion million cycles

• 倒角

  0.38-1.14 mm face width

• 倒角公差

  45° ±15°

• 清洁

  See How to Clean Optics

• 通光孔径

  > central 80% of diameter

• 损伤阈值

  500 W/cm2 CW, 1.0 J/cm2 with 10 nsec pulses, typical

• 直径公差

  +0/-0.13 mm

• 楔形

  30 ±15 arc min

• 厚度

  9.4 mm  

• 厚度公差

  ±0.38 mm

20 q40nc。2宽带束取样器是一个2.0英寸(50.8毫米)直径,9.40毫米厚,紫外线石英玻璃梁λ/ 20表面平面度的取样器。背面涂有660 ~ 1000纳米的防反射涂层。我们的宽带波束采样器被设计成通过菲涅尔反射将波束分离或取样，用于需要对传输波束进行最小干扰的波束监控应用。